設(shè)備介紹 一裂片后的OLEDCell,在還沒BondDriverIC之前,將所有正極短路,所有負(fù)極亦短路(以PM型為例),而后在該二端點(diǎn)上加上正及負(fù)的電壓做測試該交流測試電壓的大小,頻率,及周波數(shù)皆為Programmable(可在主控PC上設(shè)定),在一次的交流測試后,緊接著為量測段,使用者先設(shè)定反偏電壓,HA570會對每一片面板量測其反偏逆電流并記錄,解析精度至10nA.無論順向或逆向,HA570均提供限流保護(hù),可使某些先期不穩(wěn)定的產(chǎn)品不至于斷電而有可能在持續(xù)的交流測試中復(fù)元.OLEDCell是置于治具 電木Tray盤上,一個(gè)Tray可置放30pcCells,一爐共可容納:24Trayx30Cell=720Cell/爐. AgingProcessItemParameter RemarkTotalcycleProgrammable1~100 Tt1~250min.,1min.stepFwdVoltageTm60sec.MeasurementcycletimeVft0~+20V,0.1VstepSetforeachcycle/eachtrayVrt0~-20V,0.1VstepSetforeachcycle/eachtrayVrm0~-20V,0.1VstepReversevoltageofTm,Setforeachcyclef1~100Hz,1Hzstep1/T,FrequencyofTtDutycycle5%~100%,1%stepTf/T,risingtime/fallingtime 10uSIf200mAmax.Outputcurrent MeasurementItemParameter RemarkIF0.1mA~200mA,0.1mAstepFwdcurrentIrAccuracy:1.10nA~1uA:10nA2.1uA~100uA:5%Static-stateLeakageCurrent CurrentLimitItemParameterRemarkIfcurrentlimit200mASetforeachcellIRcurrentlimit200mASetforeachcell